图像传感器测试系统IP750EX-HD
The Global Leader in Image Sensor Testing
Why does the IP750Ex-HD lead the market? It’s a trusted fourth-generation test system that delivers image sensor test capability for current and future devices while providing the lowest cost of test.
Our customers know that Teradyne’s worldwide applications support provides unparalleled test expertise. All of which may explain why the image sensor market has consistently selected the IP750Ex-HD Image Sensor Test System as their test solution.
IP750EX-HD一直是测试平台，使业界能够制造高质量的CCD和CMOS图像传感器，并且是满足较新技术的需求的最经济平台（TOF）传感器。当您使用智能手机，高性能数码相机或家庭安全和监控系统时，这些应用程序具有最可能由Teradyne的IP750EXHD测试的图像传感器。betway桌面应用
由于图像传感器正在设计具有更多功能，Teradyne的IP750Ex-HD继续扩展测试覆盖范围。betway桌面应用“传感”设备现在包括距离测距，3D深度感测，增强现实（AR），虚拟现实（VR），汽车安全和先进的驾驶员辅助系统（ADAS）应用。移动应用正在增加用于用户认证的多个摄像机和指纹扫描相机的采用。设备设计的复杂性增加提高了测试时间。而且，汽车应用看到通过在封装的设备测试中受到低温和高温测试的增加的测试插入。
How do we improve test times and time to market as image sensors become more complex? Teradyne’s IP750Ex-HD operates with the award-winningIG-XL™ software。图像传感器供应商知道用户友好的软件提供从研发到生产的最快时间。
The IP750Ex-HD is architected to meet the increasing demands of higher resolution image sensors, expanding test quality standards, and innovative new sensor features with varying wavelengths of light and modulation features. The architecture supports 64-bit image data processing to meet the processing demands of increasingly higher resolution sensors, and the data transfer utilizes the fastest data busses to ensure that the fastest test times are achieved. While Teradyne provides image processing libraries and applications expertise to make it easy for test engineers, IG-XL™ also allows customers to implement customized image test algorithms to both create and protect their test IP.
Advantages
强大的处理器银行for running the most advanced image test algorithms for high resolution devices
高速并行数据传输每仪器40Gbps
最多80个网站在并行测试中
Scalable computing and high data movement architecture确保所有传感器类型的测试成本最低 - 从低位站点计数特种传感器到大容量图像传感器
Secure and easy support对于客户专有测试算法
广泛的设备覆盖范围
- 用于测试广泛的设备 - VGA到超过100米像素的高通用性，具有许多图像输出捕获标准能力
- 仅具有自定义LVDS协议覆盖范围的市场中的仪器解决方案
- 具有SOC型图像传感器的数字仪器的强SOC测试能力
配置
IP750EX.-HD
- 80-site system capable for wafer test
- ICMD 1.5 gbps MIPI D-Phy图像捕获工具
- Custom LVDS capture capability with ICMD
- D-PHY 2.5Gbps image capture unit
- C-PHY 2.5Gsps image capture unit
- M-PHY 6.0Gbps image capture unit
- HSD800 400MHz数字仪器
- HDDPS 24/48Ch DC source
- 40Gbps image data transfer
- 150mm x 160mm发光器支撑
- 兼容J750EX-HD仪器
系统选项
VI Resources
- APMU: 64Ch, -35V to 35V, 50mA@35V capability, merge x8 /400mA
- HDVIS: -10V to 10V, 200mA@10V capability, merge x4/800mA
转换器测试
- CTO：8个源，8个捕获，16位ADC测试
- HDCTO：32源，32个电压参考，8捕获，14位ADC测试